Fluorescence Distribution Imaging System EEM ® View
The fluorescence distribution imaging system adopts a completely new design, which can measure and observe the spectral data of samples. Utilizing AI spectral image processing algorithm*1Not only can it display the fluorescence and reflection images of the sample separately, but it can also obtain spectral images of different regions*1(Fluorescence spectra, reflectance spectra).
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- The computing system is the result of joint research by Professor IMARI SATO and Associate Professor Zheng Yinqiang at the National Institute of Informatics.
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- EEM "is a registered trademark of Hitachi High Tech Sciences in China and Japan
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characteristic
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Application Data
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index
characteristic
What is EEM View
New technology can simultaneously obtain fluorescence reflection images and spectra
- Measure the spectral data of the sample (reflectance spectrum, fluorescence spectrum)
- Take samples under different light source conditions (white light and monochromatic light)
(Region: Φ 20 mm, wavelength range: 380~700 nm) - Adopting AI spectral image processing algorithm*1, capable of displaying sample fluorescence images and reflection images separately
- Spectral information of different regions can be obtained based on the image*1(Fluorescence spectra, reflectance spectra)
- *1
- The computing system is the result of joint research by Professor IMARI SATO and Associate Professor Zheng Yinqiang from the National Institute of Informatics
EEM View Analysis interface (sample: LED circuit board)
Overview of Fluorescence Distribution Imaging System
Uniform light source system
Simultaneously obtain fluorescence reflection images and spectra of the sample!
- Integral sphere diffuse reflection makes the light source uniform
- Using the light collected by the integrating sphere to uniformly irradiate the sample
- Adopting dual detection mode of fluorescence detector and CMOS camera
The new fluorescence distribution imaging system can be installed in the sample chamber of the F-7100 fluorescence spectrophotometer. After diffuse reflection by the integrating sphere, the incident light is uniformly irradiated onto the sample. The fluorescence spectrum of the sample can be obtained using the standard fluorescence detector of F-7100. Combined with the CMOS camera below the integrating sphere, the sample image can be obtained. Using a unique AI spectral image processing algorithm, both reflection and fluorescence images can be obtained simultaneously.
The sample installation is simple and suitable for various sample tests!
The sample only needs to be placed on the integrating sphere, and installation is very simple!
- Plate shaped sample: Install the sample through a quartz window.
- Powder sample: Fill the powder into the sample leveling fixture, place it on the powder sample pool bracket, or install the sample using the powder sample pool in the optional solid sample bracket.
- During calibration, it is necessary to place the fluorescent standard sample properly.
- Please use the optional standard whiteboard (100%) and blank sample (0%) for calibration. This correction tool can be applied to fluorescence intensity, reflectance correction, and brightness distribution correction in different areas of the image.
Application Data
[Application Example] Fluorescence Characteristics and Structural Confirmation of Microstructure Materials
To improve visibility, we measured fluorescent reflectors with fine structures.
Simultaneously obtaining spectral data and sample images
Illuminate the sample with monochromatic light and white light within the range of 360 nm to 700 nm. At this point, images under different light source conditions can be obtained, and fluorescence spectra can be obtained through a fluorescence detector. After the measurement is completed, the three-dimensional fluorescence spectrum of the sample (excitation wavelength, emission wavelength, fluorescence intensity) can be viewed. In specialized analysis software, images can be enlarged to display fluorescence and reflectance spectra of different regions. Therefore, it is possible to confirm the reflection and fluorescence spectra of samples with uneven optical performance distribution.
Calculate and display spectra (fluorescence and reflection) of different regions
Display separated images (fluorescence reflection)
Separate the reflected light component image from the fluorescence component image of the captured image
Using AI spectral image processing algorithms, the captured image is separated into reflected light component and fluorescent component images. As a result, the reflected light component image is displayed in orange, and the fluorescent component image is displayed in green. Both are consistent with the monochromatic light in the reflection spectrum and fluorescence spectrum, respectively. From this, it can be seen that this sample is a mixture of orange reflected light and green fluorescence, so it appears yellow under white light. In addition, the optical characteristics (image patterns) of different regions of the sample can be observed through reflection images and fluorescence images. After zooming in on the image, it can be seen that there are regular intervals in the microstructure of the reflector, with a spacing width of 200 μ m.
index
major function
project | content |
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EEM View mode (Measurement mode) |
Determination of three-dimensional fluorescence spectra |
Monochromatic light image | |
White light image | |
Preview Image | |
data processing | show thumbnail |
Display three-dimensional fluorescence spectra (contour lines, gradient plots) | |
Display excitation/emission spectra | |
Display enlarged image | |
Image partitioning (1 × 1, 2 × 2, 3 × 3, 4 × 4, 5 × 5) | |
Calculate and display spectra of different regions (fluorescence, reflection)*1 | |
Display separated images (fluorescence, reflection)*1 |
- *1
- The computing system is the result of joint research by Professor IMARI SATO and Associate Professor Zheng Yinqiang from the National Institute of Informatics
specifications
project | content |
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Illumination wavelength |
360 nm ~700 nm |
camera | Color (RGB) CMOS sensor |
interface |
USB3.0 |
Effective Pixels | 1920 × 1200(H×V) |
Capable of capturing wavelength range |
380 nm ~700 nm |
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- The main specifications of this accessory are based on the design of the fluorescence spectrophotometer mainframe.
Configuration Example
name | P/N (serial number) |
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F-7100 fluorescence spectrophotometer |
5J1-0042 |
EEM View Accessories |
5J0-0570 |
R928F photomultiplier tube |
650-1246 |
Secondary standard light source |
5J0-0136 |
application
Introduce measurement examples of spectrophotometer (FL).
Accurate Spectral Measurement of Fluorescence Spectrophotometer
Introduce methods for correcting machine errors between devices and removing scattered light.
Fluorescence spectra of solid samples
Introduce an example of fluorescence spectroscopy measurement using a solid-state sample holder (optional) plasma display.
Science Environment
Introduce the symbol of Hitachi High Tech Science Group, which aims to become a leader in the technology field.